1999 南京大学学士 2004 南京大学硕士 2009 德国柏林洪堡大学物理系博士 2010 - 2017 澳大利亚莫纳什大学电子显微中心 (MCEM) Tenured Research Fellow 2017 - 至今复旦大学物理系研究员

发展基于像差校正的新型透射电子显微学技术(TEM)并应用于凝聚态物理和材料科学研究 实验手段包括原子尺度球差校正STEM和TEM, 双球差校正三维共聚焦电子显微镜(SCEM), 相干电子衍射 (Coherent CBED), 电子全息及Lorentz显微镜, 电子能量损失谱(EELS)和EDX, Phase Imaging, 微分相衬电子显微镜 (DPC), ptychography, 电子束相位及空间调制(Bessel beam, Airy beam等新型电子束)。理论工作集中于研究电子的散射及物理光学过程。

电子显微学(Electron Microscopy)

C. L. Zheng, T. Petersen, H. Kirmse, W. Neumann, M. Morgan, J Etheridge, Axicon lens for electrons using a magnetic vortex: The efficient generation of a Bessel beam, Phys. Rev. Lett. 119 (17), 174801 (2017). (Editors’ suggestion) C.L. Zheng, H. Kirmse, J. Long, D. Laughlin, M. McHenry, W. Neumann, Investigation of (Fe, Co) NbB-Based nanocrystalline soft magnetic alloys by Lorentz microscopy and off-axis electron holography, Microscopy and Microanalysis 21 (02), 498-509 (2015). (Cover image) C.L. Zheng, Y. Zhu, S. Lazar, J. Etheridge, Fast imaging with Inelastically scattered electrons by off-axis chromatic confocal electron microscopy, Phys. Rev. Lett. 112 (16), 166101 (2014). (Editors’ suggestion and featured in Physics Today). C.L. Zheng, J. Wong-Leung, Q. Gao, H.H Tan, C. Jagadish, J. Etheridge, Polarity-driven 3-fold symmetry of GaAs/AlGaAs core multishell nanowires, Nano Lett. 13 (8), 3742-3748 (2013). C.L. Zheng, J. Etheridge, Measurement of chromatic aberration in STEM and SCEM by coherent convergent beam electron diffraction, Ultramicroscopy 125, 49-58 (2013). CL Zheng, K. Scheerschmidt, H. Kirmse, I. H?usler, W. Neumann, Imaging of three-dimensional (Si, Ge) nanostructures by off-axis electron holography, Ultramicroscopy 124, 108-116 (2013).