Associate Professor, UESTC, 2012 Research Assistant, Dept. of Phys., HKU, 2012 PhD. in Materials Physics and Chemistry, UESTC, 2010 Research Assistant, Dept. of Electronic Engineering, CUHK, 2006/2007

1. H. Z. Zeng, “Interface charge trapping of ferroelectric/AlGaN/GaN heterostructures”, International Conference on New Theories, Discoveries and Applications of Superconductors and Related Materials，Chongqing, China, Jun 6-8, 2011. 2. H .Z. Zeng, “Ferroelectric thin films investigated by piezoresonse force microscopy”, MRS Spring Meeting, San Francisco, April 9-13, 2007 1. H. Z. Zeng, J.S. Liu. Nanoscale static and dynamic domain structures of ferroelectric thin films. Trends in Thin Solid Films Research. New York: Nova Science Publishers, 165-192 (2007) 1. J. H. Zhang, H. Z. Zeng, M. Zhang, W. Liu, Z. F. Zhou, H. W. Chen, C. R. Yang, W. L. Zhang, Y. R. Li, Probe pressure dependence of nanoscale capacitance-voltage characteristic for AlGaN/GaN heterostructures. Review of Scientific Instruments 81(2010) 103704. 2. H. Z. Zeng, L. Z. Hao, W. B. Luo, X. W. Liao, W. Huang, Y. Lin, Y. R. Li, Trapping properties of LiNbO3/AlGaN/GaN metal-ferroelectric-semiconductor heterostructure characterized by temperature dependent conductance measurements. Journal of Applied Physics 107(2010) 084508. 4. L. Z. Hao, J. Zhu, W. B. Luo, H. Z. Zeng, Y. R. Li, Y. Zhang, Electron trap memory characteristics of LiNbO3 film/AlGaN/GaN heterostructure. Applied Physics Letters 96(2010) 032103. 5. H. Z. Zeng, H. M. Sun, W. B. Luo, W. Huang, Z. H. Wang, Y. R. Li, Nanoscale capacitance spectroscopy characterization of AlGaN/GaN heterostructure by current-sensing atomic force microscopy. Journal of Applied Physics 105(2009) 094319. 6. L. Z. Hao, J. Zhu, W. B. Luo, H. Z. Zeng, Y. R. Li, W. Huang, X. W. Liao, Y. Zhang, Epitaxial fabrication and memory effect of ferroelectric LiNbO3 film/AlGaN/GaN heterostructure. Applied Physics Letters 95(2009) 232907. 7. X. H. Wei, Y. R. Li, W. J. Jie, J. L. Tang, H. Z. Zeng, W. Huang, Y. Zhang, J. Zhu, Heteroepitaxial growth of ZnO on perovskite surfaces. Journal of Physics D-Applied Physics 40(2007) 7502. 8. J. S. Liu, H. Z. Zeng, A. L. Kholkin, Cross-sectional analysis of ferroelectric domains in PZT capacitors via piezoresponse force microscopy. Journal of Physics D-Applied Physics 40(2007) 7053. 9. J. Shen, H. Z. Zeng, Z. H. Wang, S. B. Lu, H. D. Huang, J. S. Liu, Study of asymmetric charge writing on Pb(Zr,Ti)O-3 thin films by Kelvin probe force microscopy. Applied Surface Science 252(2006) 8018. 10. J. S. Liu, S. R. Zhang, H. Z. Zeng, C. T. Yang, Y. Yuan, Coercive field dependence of the grain size of ferroelectric films. Physical Review B 72(2005) 172101.