Fellow, Materials Research Society (MRS) Fellow, Institute of Electrical and Electronics Engineers (IEEE) Fellow, American Physical Society (APS) Fellow, The Electrochemical Society (ECS) Fellow, American Society of Materials (ASM) Fellow, American Association for Advancement of Science (AAAS)

Semiconductor Processing; Oxide thin films; III-V Semiconductors; Ultra-hard materials; Emerging advanced materials; laser processing

R. K. Singh, D. R. Gilbert, J. Fitz-Gerald, S. Harkness and D-G Lee, "Engineered Interfaces for Adherent Diamond Coatings on Large Thermal-expansion Coefficient Mismatched Substrates," Science, 272, 396-398 (1996). Times Cited: 50 R. K. Singh and J. Narayan, "Pulsed-laser Evaporation Technique for Deposition of Thin Films: Physics and Theoretical Model," Physical Review B, 41, 8843-8859 (1990). Times Cited: 530 R. K. Singh, O. W. Holland and J. Narayan, "Theoretical Model for Deposition of Superconducting Thin Films Using Pulsed Laser Evaporation Technique," Journal of Applied Physics, 68, 233-247 (1990). Times Cited: 160 J. Narayan, N. Biunno, R. K. Singh, O. W. Holland and O. Auchiello, "Formation of Superconducting Thin Films by Laser Processing Method," Applied Physics Letters, 51, 1845-1847 (1987). Times Cited: 153 R. K. Singh, J. Narayan, A. K. Singh and J. Krishnaswamy, "In Situ Processing of Epitaxial Y-Ba-Cu-O High Tc Superconducting Thin Films on (100) SrTiO3 and (100) YS-ZrO2 Substrates at 500-650oC," Applied Physics Letters, 54, 2271-2273 (1989). Times Cited: 130 S. L. Jones, D. Kumar, R. K. Singh and P. H. Holloway, “Luminscence of Pulsed Laser Deposited Eu Doped Yttrium Oxide Thin Films,” Applied Physics Letters, 71, 404-407 (1997). Times Cited: 168 K-G Cho, D. Kumar, P. H. Holloway and R. K. Singh, “Luminescence Behavior of Pulsed Laser Deposited Eu: Y2O3 Thin Film Phosphors on Sapphire Substrates,” Applied Physics Letters, 73 (21), 3058-3060 (1998). Times Cited: 100 Y. Rabinovich, J. Adler, A. Ata, R. K. Singh and B. M. Moudgil, “Adhesion Between Nanoscale Surfaces: I. Role of Asperity Geometry,” Journal of Colloid and Interfacial Science, 232,10-16 (2000). Times Cited: 98 Y. Rabinovich, J. Adler, A. Ata, R. K. Singh and B. Moudgil, “Adhesion Between Nanoscale Surfaces: II. Measurement and Comparison with Theory,” Journal of Colloid and Interfacial Science, 232, 17-24 (2000). Times Cited: 87 R. K. Singh, S. M. Lee, K. S. Choi, G. B. Basim, W. S. Choi, Z. Chen, B. M. Moudgil, "Fundamentals of slurry design for CMP of metal and dielectric materials", MRS Bulletin, 27, 10, 752-760 (2002) Times Cited: 50